Politecnico di Milano, in cooperation with Thermo Fisher Scientific, IONTOF, and Gambetti Kenologia, is proud to invite researchers to the 2022 XPS-TOF SIMS Workshop on “Advanced micro and nano-characterization of hybrid interfaces – A multidisciplinary approach”. Two special remote demonstrations of the last release of Thermo Fisher Escalab QXi and IONTOF M6 will take place.
Date: 7 November 2022
Time: 08.45 am – 06.00 pm
Venue: Aula Magna, Campus Leonardo, Piazza Leonardo da Vinci, 32 Milano, Italy
The one-day event is free of charge and requires a registration in advance before 1st November 2022.
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PROGRAM
The program is regularly updated.
First panel | Chairman: Rossella Yivlialin
08:45 Welcoming & Introduction
P. Carrozzo/S. Fabbri – Gambetti Kenologia
S. Kayser – IONTOF
C. Deeks – Thermo Fisher
08:55 Guest Talk
Alberto Calloni, Politecnico di Milano
X-ray photoemission spectroscopy as a key technique to highlight intercalation processes in graphite electrodes
09:25 Guest Talk
Christopher Deeks, Thermo Fisher
Combining XPS and Other Surface Analysis Techniques for in-situ Analysis
09:55 Guest Talk
Antonella Rossi, Università di Cagliari
Analytical challenges in XPS: understanding corrosion and tribological tested samples
10:25 Guest Talk
Giorgio Speranza, Fondazione Bruno Kessler
X-Ray Photoelectron Spectroscopy and characterization of the material’s surface
10:55 Coffee Break
Second panel | Chairman: Francesco Goto
11:15 Guest Talk
Elena Magnano, IOM – CNR Elettra Sincrotrone
Soft X-Ray spectroscopy at liquid/solid interface: in-situ and operando investigations at BACH beamline
11:45 Guest Talk
Luca Schio, IOM-CNR Elettra Sincrotrone
On Surface trans-metalation of Zinc Tetraphenyl Porphyrin on rTiO2(110)
12:15 Guest Talk
Marzio Rancan, CNR – ICMATE
XPS: a powerful tool for understanding functional materials
12:45 Guest Talk
Letizia Savio, Università di Genova
C-based nanostructures on Ag (110). What do we learn by XPS?
13:15 Lunch Break
Third panel | Chairman: Alberto Calloni
14:00 Guest Talk
Sven Kayser, IONTOF
Time-of-Flight SIMS: From static surface characterization to three-dimensional organic and inorganic micro area analysis
14:30 Guest Talk
Luca Tortora, INFN Università di Roma Tre
ToF-SIMS in solid state chemistry and physics
15:00 Guest Talk
Giacomo Ceccone, JRC Ispra
Needs and Challenges in Nanomaterials characterisation by XPS and ToF-SIMS
15:30 Guest Talk
Giorgio Speranza, Fondazione Bruno Kessler
RxpsG a new open project for XPS AES data processing
Coffee Break 16:00
Fourth panel | Chairman: Gianlorenzo Bussetti
16:20 Guest Talk
Vito Di Noto, Università di Padova
Near-Ambient-Pressure XPS: a New Frontier in Surface Science
16:50 Guest Talk
Elena Dilonardo, CNR – Nanotec
X-ray photon electron spectroscopy as structural and chemical surface probe on 2D chalcogenides layers
17:20 Remote XPS Demo
Christopher Deeks, Thermo Fisher Scientific
Escalab QXi remote demo
17:40 Remote TOFSIMS Demo
Sven Kayser, IONTOF
M6 remote demo
18:00 Closing Remarks
P. Carrozzo/S. Fabbri – Gambetti Kenologia
S. Kayser – IONTOF
C. Deeks – Thermo Fisher
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A special THANK YOU to Prof. Gianlorenzo Bussetti and Prof. Edoardo Albisetti from the Physics Department of Politecnico di Milano for hosting the event.
